Delay Fault Testing For VLSI Circuits(1st Edition)
Authors:
Angela Krstic Kwang-Ting Cheng
In Stock
Shipment time
Expected shipping within 2 DaysPopular items with books
Total Price:
$0
Solution Manual Includes
Price:
$9.99
Book details
ISBN: 0792382951, 978-0792382959
Book publisher: Springer
Customers also bought these books
Power Constrained Testing Of VLSI Circuits - 1st Edition
Nicola Nicolici
ISBN: 140207235X, 978-1402072352
$0 $11.22Frequently Bought Together
Intermediate Accounting Reporting and Analysis - 3rd edition
James M. Wahlen
ISBN: 9781337909402, 978-1337788281
$0 $17.74
Holes Human Anatomy And Physiology - 15th Edition
David Shier
ISBN: 1260092828, 978-1260092820
$0 $76.00
Internal Auditing Assurance & Advisory Services - 4th Edition
Urton L. Anderson
ISBN: 0894139878, 978-0894139871
$0 $79.86
The Ultimate Credentialing Guide Step By Step Guide For Medical Providers And Business Owners - 1st Edition
Nisha Clinkscale
ISBN: B0CYZZZRXJ, 979-8218399252
$0 $20.99
Data Modeling Master Class Training Manual Steve Hobermans Best Practices Approach To Understanding And Applying Fundamentals Through Advanced Modeling Techniques - 10th Edition
Steve Hoberman
ISBN: 1634628616, 978-1634628617
$0 $149.66
Digital Timing Measurements From Scopes And Probes To Timing And Jitter - 1st Edition
Wolfgang Maichen
ISBN: 1841270253, 978-0387314181
$0 $131.01
Boundary Scan Interconnect Diagnosis - 1st Edition
José T. De Sousa
ISBN: 0792373146, 978-0792373148
$0 $12.24Top Reviews for Books
