Journey To Data Quality(1st Edition)

Authors:

Leo L Pipino, Richard Y Wang

Type:Hardcover/ PaperBack / Loose Leaf
Condition: Used/New

In Stock: 1 Left

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Book details

ISBN: 0262300028, 9780262300025

Book publisher: The MIT Press

Customer Reviews

Trusted feedback from verified buyers

OB
Owen Bentley
5.0
Clarity. Depth. Brilliant explanations. Authors did best. Highly recommend to everyone!
KL
Kyle Lawson
4.0
This book has been a rewarding journey. The content is robust, albeit a tad overwhelming if you're entirely new to the field. However, the practical tests are excellent for hands-on learners. My book arrived well-packaged, and my subscription saved me a bit of cash.