Journey To Data Quality(1st Edition)
Authors:
Leo L Pipino, Richard Y Wang
Type:Hardcover/ PaperBack / Loose Leaf
Condition: Used/New
In Stock: 1 Left
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Book details
ISBN: 0262300028, 9780262300025
Book publisher: The MIT Press
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Customer Reviews
Trusted feedback from verified buyers
OB
Clarity. Depth. Brilliant explanations. Authors did best. Highly recommend to everyone!
KL
This book has been a rewarding journey. The content is robust, albeit a tad overwhelming if you're entirely new to the field. However, the practical tests are excellent for hands-on learners. My book arrived well-packaged, and my subscription saved me a bit of cash.






























