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Structural Syntactic And Statistical Pattern Recognition Joint Iapr International Workshop S+sspr 20 M Rida Mexico November 29 December 2(1st Edition)
Authors:
Antonio Robles Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson
Cover Type:Hardcover
Condition:Used
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Book details
ISBN: 3319490540, 978-3319490540
Book publisher: Springer
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