The article Limited Yield Estimation for Visual Defect Sources (IEEE Trans. on Semiconductor Manuf., 1997: 17-23) reported

Question:

The article "Limited Yield Estimation for Visual Defect Sources" (IEEE Trans. on Semiconductor Manuf., 1997: 17-23) reported that, in a study of a particular wafer inspection process, 356 dies were examined by an inspection probe and 201 of these passed the probe. Assuming a stable process, calculate a 95% (two-sided) confidence interval for the proportion of all dies that pass the probe.