Failure times of silicon wafer microchips. Refer to the National Semiconductor study of manufactured silicon wafer integrated
Question:
Failure times of silicon wafer microchips. Refer to the National Semiconductor study of manufactured silicon wafer integrated circuit chips, Exercise 12.78
(p. 725). Recall that the failure times of the microchips (in hours) were determined at different solder temperatures (degrees Celsius).
The data are repeated in the table in the next column.
a. Fit the straight-line model E1y2 = b0 + b1x to the data, where y = failure time and x = solder temperature.
b. Compute the residual for a microchip manufactured at a temperature of 152°C.
c. Plot the residuals against solder temperature (x). Do you detect a trend?
d. In Exercise 12.78c, you determined that failure time (y)
and solder temperature (x) were curvilinearly related.
Does the residual plot, part
c, support this conclusion?
Step by Step Answer:
Statistics Plus New Mylab Statistics With Pearson Etext Access Card Package
ISBN: 978-0134090436
13th Edition
Authors: James Mcclave ,Terry Sincich