Suppose that, with the evolution of the electronic devices manufacturing technology, the yield varies as shown in
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Suppose that, with the evolution of the electronic devices manufacturing technology, the yield varies as shown in the following table.
Find the defects per area unit for each technology given a die area of 200 mm2.
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Computer Organization And Design The Hardware Software Interface
ISBN: 9780123747501
4th Revised Edition
Authors: David A. Patterson, John L. Hennessy
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