Instead of using dual port flip flops of the type shown in Figure 10 8, scan testing can be accomplished using standard D flip lops with a MUX on each D input to select D 1 or D 2 Redraw the circuit of Figure 1 22 to establish a scan chain using D flip flops and MUXes A test signal (T) should contr...

Instead of using dual-port flip-flops of the type shown in Figure 10-8, scan testing can be accomplished

Question:

Instead of using dual-port flip-flops of the type shown in Figure 10-8, scan testing can be accomplished using standard D flip-lops with a MUX on each D input to select D₁ or D₂. Redraw the circuit of Figure 1-22 to establish a scan chain using D flip-flops and MUXes. A test signal (T) should control the MUXes.

Fantastic news! We've Found the answer you've been seeking!