The circuit in Figure P11.5 determines the parity of a four-bit data unit. Derive a minimal test

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The circuit in Figure P11.5 determines the parity of a four-bit data unit. Derive a minimal test set that can detect all single stuck-at-0 and stuck-at-1 faults in this circuit. Would your test set work if the XOR gates are implemented using the circuit in Figure 8.9c? Can your result be extended to a general case that involves n-bit data units?

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