The following failure time observations (1000s of hours) resulted from accelerated life testing of 16 integrated circuit chips of a certain type: 82.81 11.6 359.5 502.5 307.8 179.7 242.0 26.5 244.8 304.3 379.1 212.6 229.9 558.9 366.7 204.6 Use the corresponding percentiles of the exponential distribution with A = 1 to construct a probability plot. Then explain why the plot assesses the plausibility of the sample having been generated from any exponential distribution.