A commercially pure piece of copper is cold worked and then its x-ray diffraction pattern is obtained using monochromatic CuK(=0.1542nm)x-rays. The same sample is then given an annealing treatment and its x-ray diffraction pattern is obtained again. Using the diffraction data of the cold worked (Coldworked_Cu.txt) and annealed (Annealed_Cu.txt) samples, determine the strain and crystallite size for the cold worked Cu. Assume: 1) Bexp=Bsize+Bstrain+Binst 2) The annealed sample is strain free and has a very large grain size so that the only source of broadening for this sample is the instrumental broadening (i.e. Bexp=Binst ). 3) There is no texture in the samples