COPYVI We have begun fabrication of a wafer with the number of die per wafer as shown. We know the size of the wafer, and how many defects per square centimeter there are. If we assume defects are distributed perfectly evenly, fill in the missing values below. BB does a poor job by default of aligning cells in tables, but hopefully you can make it out. I am supply the first three values. ratio #bad #good yield die count 339 die cm2 0.5 defect dist 4.9 Calculate the ratio to two rounded digits past the decimal point. Example: 0.26704 --> 0.28. This tell us how often the defects appear as a function of the die size. Bad die count: Good die count: Yield: (good die to total die, calculated to 2 digits past the decimal point. ex: 10 good die with 45 die count = 0.22 yield.) A second set: ratio # bad #good yield die count 103 die cm2 3.2 defect dist 2.9 Ratio: # Bad: # Good: Yield