Failure unIT(FIT) is the measure for failure rates of electronic components which is expressed as a rate of failures per billion device hours. Then, the mean time between failures (MTBF), which is the average time of operation of a particular component until it fails. If a 2 MB memory that is design with 256Kx4 DRAM, calculate this memorys MTBF assuming 1000 FITs for the DRAM.