Four cells of components were put on test at temperatures of 110 C, 120 C, 130 C, and 140 C to model a failure mechanism with an Arrhenius acceleration model. The lowest temperature cell had 100 units on test; all other cells contained 50 units. Readouts were taken at 24, 48, 96, 150, 500, and 1000 hours. The test ended at the last readout, and the data are summarized below. 110 C Cell Readout Hours 120 C Cell 130 C Cell 140 C Cell New Failures New Failures New Failures New Failures 24 O O 2 48 O 96 O 3 150 O O 1 500 10 1000 3 8 10 Unfailed 96 42 33 23 Use a Weibull life distribution and estimate , AH, and the use CDF at 40,000 hours at a use temperature of 60 C. Repeat the analysis using a lognormal distribution. Which distribution appears to fit the data better? Use MLE fits and look at probability plots