I need help understanding both questions 1 and 2 as well as the solutions. Thanks!

Solve the following problems 1. A yield improvement study at a semiconductor manufacturing facility provided defect data for a sample of 450 wafers. The following table presents a summary of the responses to two questions: " Was a particle found on the die that produced the wafer?' and " Is the Wafer good or bad?" Condition of Die Quality of Wafer No particles particles Total Good 320 14 334 Bad 80 36 116 Totals 400 50 450 1. Give an example of a simple event 2. Give an example of a joint event 3. What is the complement of a good wafer 2. You are the manager of a fast-food restaurant. You want to determine whether the waiting time to place an order has changed in the last month from its previous population mean value of 4.5 minutes. From past experience, you can assume that the population standard deviation is 1.2 minutes. You must select a sample of 25 orders during a one-hour period. The sample mean is 5.1 minutes. Determine whether there is evidence at the 0.05 level of significance that the mean waiting time to place an order has changed in the last month from its previous population mean value of 4.5 minutes. Compile your files into one document when submitting your assignment