The first problem focuses on simplified results of the Xilinx XQR5VFX130 SRAM based FPGA summarized in:

Allen, G., Edmonds, L., Tseng, C.W., Swift, G. and Carmichael, C. Single-Event Upset (SEU) Results of Embedded Error Detect and Correct Enabled Block Random Access Memory (Block RAM) Within the Xilinx XQR5VFX130. IEEE TNS Vol. 57, No. 6, December 2010, pp. 3426-3431.

It is not necessary (or required) that students acquire and read the paper to complete the homework assignment. Students are, of course, welcome to read and digest the entirety of the paper but we will focus on the data presented in Table II of the paper and reproduced here under.

The right most column reflects the experimentally observed uncorrected BRAM errors per device. The XQR5VFX130 contains 10,368 kbit BRAM. Determine the observed uncorrected BRAM errors per bit for each Run (row) in the above table. Then determine the uncorrected BRAM cross section in units of cm2/b it for each Run (row) in the above table. The right most column reflects the experimentally observed uncorrected BRAM errors per device. The XQR5VFX130 contains 10,368 kbit BRAM. Determine the observed uncorrected BRAM errors per bit for each Run (row) in the above table. Then determine the uncorrected BRAM cross section in units of cm2/b it for each Run (row) in the above table