15.4. In Problem 8.25 a replicated fractional factorial design was used to study substrate camber in semiconductor

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15.4. In Problem 8.25 a replicated fractional factorial design was used to study substrate camber in semiconductor manufacturing.

Both the mean and standard deviation of the camber measurements were used as response variables. Is there any indication that a transformation is required for either response?

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Design And Analysis Of Experiments

ISBN: 9781118146927

8th Edition

Authors: Douglas C. Montgomery

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Question Posted: Sep 18, 2024 10:01 AM

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15.4. In Problem 8.25 a replicated fractional factorial design was used to study substrate camber in semiconductor

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Design And Analysis Of Experiments

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