59. The relative conductivity of a semiconductor device is determined by the amount of impurity doped into

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59. The relative conductivity of a semiconductor device is determined by the amount of impurity doped into the device during its manufacture. A silicon diode to be used for a speci c purpose requires an average cut-on voltage of .60 V, and if this is not achieved, the amount of impurity must be adjusted.

A sample of diodes was selected and the cut-on voltage was determined. The accompanying SAS output resulted from a request to test the appropriate hypotheses.

N Mean Std Dev T Prob 15 0.0453333 0.0899100 1.9527887 0.0711

[Note: SAS explicitly tests H0: m  0, so to test H0:

m  .60, the null value .60 must be subtracted from each xi; the reported mean is then the average of the

(xi  .60) values. Also, SAS s P-value is always for a two-tailed test.] What would be concluded for a signi cance level of .01? .05? .10?

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