In a semiconductor manufacturing process, three wafers from a lot are tested. Each wafer is classified as pass or fail. Assume that the probability that a wafer passes the test is 0.6 and that wafers are independent. Determine the cumulative distribution function of the number of wafers from a lot that pass the test at specified values. Round your answers to three decimal places (e.g. 98.765). F(0) = P(XSO) = i F(1) = P(XS 1) = i F(2) = P(XS 2) = F(3) = P(X