Thirty observations on the oxide thickness of individual silicon wafers were observed. Using the data provided in Canvas

answer the following questions. Must use Minitab to support your responses.

a$.(2$ points$)$ Is it reasonable to assume that the oxide thickness follows a normal distribution? Explain.

b$.(1$ point$)$ Setup a control chart and comment if it exhibits statistical control.

c$.(2$ points$)$ Following the establishment of the control charts, the oxide thickness of $10$ new wafers were recorded.

Plot these new observations against the control limits developed in part $($b$).$ Is the process in control