19. The number of contaminating particles on a silicon wafer prior to a certain rinsing process was...

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19. The number of contaminating particles on a silicon wafer prior to a certain rinsing process was determined for each wafer in a sample of size 100, resulting in the following frequencies:

Number of particles 01234 567 Frequency 1 2 3 12 11 15 18 10 Number of particles 8 9 10 11 12 13 14 Frequency 12 4 5 3 1 2 1

a. What proportion of the sampled wafers had at least one particle? At least five particles?

b. What proportion of the sampled wafers had between five and ten particles, inclusive? Strictly between five and ten particles?

c. Draw a histogram using relative frequency on the vertical axis. How would you describe the shape of the histogram?

20. The article “Determination of Most Representative Subdivision” (J. of Energy Engr., 1993: 43–55) gave data on various characteristics of subdivisions that could be used in deciding whether to provide electrical power using overhead lines or underground lines. Here are the values of the variable x  total length of streets within a subdivision:

1280 5320 4390 2100 1240 3060 4770 1050 360 3330 3380 340 1000 960 1320 530 3350 540 3870 1250 2400 960 1120 2120 450 2250 2320 2400 3150 5700 5220 500 1850 2460 5850 2700 2730 1670 100 5770 3150 1890 510 240 396 1419 2109

a. Construct a stem-and-leaf display using the thousands digit as the stem and the hundreds digit as the leaf, and comment on the various features of the display.

b. Construct a histogram using class boundaries 0, 1000, 2000, 3000, 4000, 5000, and 6000. What proportion of subdivisions have total length less than 2000? Between 2000 and 4000? How would you describe the shape of the histogram?

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